Improve ADC configuration options
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@ -6,7 +6,10 @@ use embedded_hal_02::blocking::delay::DelayUs;
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use crate::adc::{AdcPin, Instance};
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use crate::Peripheral;
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pub const VDDA_CALIB_MV: u32 = 3000;
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/// Default VREF voltage used for sample conversion to millivolts.
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pub const VREF_DEFAULT_MV: u32 = 3300;
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/// VREF voltage used for factory calibration of VREFINTCAL register.
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pub const VREF_CALIB_MV: u32 = 3000;
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/// Sadly we cannot use `RccPeripheral::enable` since devices are quite inconsistent ADC clock
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/// configuration.
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@ -44,7 +47,7 @@ impl Resolution {
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}
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}
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fn to_max_count(&self) -> u32 {
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pub fn to_max_count(&self) -> u32 {
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match self {
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Resolution::TwelveBit => (1 << 12) - 1,
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Resolution::TenBit => (1 << 10) - 1,
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@ -54,9 +57,9 @@ impl Resolution {
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}
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}
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pub struct Vref;
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impl<T: Instance> AdcPin<T> for Vref {}
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impl<T: Instance> super::sealed::AdcPin<T> for Vref {
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pub struct VrefInt;
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impl<T: Instance> AdcPin<T> for VrefInt {}
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impl<T: Instance> super::sealed::AdcPin<T> for VrefInt {
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fn channel(&self) -> u8 {
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#[cfg(not(stm32g0))]
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let val = 0;
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@ -202,7 +205,7 @@ pub use sample_time::SampleTime;
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pub struct Adc<'d, T: Instance> {
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sample_time: SampleTime,
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calibrated_vdda: u32,
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vref: u32,
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resolution: Resolution,
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phantom: PhantomData<&'d mut T>,
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}
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@ -241,12 +244,12 @@ impl<'d, T: Instance> Adc<'d, T> {
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Self {
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sample_time: Default::default(),
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resolution: Resolution::default(),
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calibrated_vdda: VDDA_CALIB_MV,
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vref: VREF_DEFAULT_MV,
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phantom: PhantomData,
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}
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}
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pub fn enable_vref(&self, delay: &mut impl DelayUs<u32>) -> Vref {
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pub fn enable_vrefint(&self, delay: &mut impl DelayUs<u32>) -> VrefInt {
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unsafe {
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T::common_regs().ccr().modify(|reg| {
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reg.set_vrefen(true);
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@ -259,7 +262,7 @@ impl<'d, T: Instance> Adc<'d, T> {
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//cortex_m::asm::delay(20_000_000);
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delay.delay_us(15);
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Vref {}
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VrefInt {}
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}
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pub fn enable_temperature(&self) -> Temperature {
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@ -282,16 +285,16 @@ impl<'d, T: Instance> Adc<'d, T> {
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Vbat {}
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}
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/// Calculates the system VDDA by sampling the internal VREF channel and comparing
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/// Calculates the system VDDA by sampling the internal VREFINT channel and comparing
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/// the result with the value stored at the factory. If the chip's VDDA is not stable, run
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/// this before each ADC conversion.
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#[cfg(not(stm32g0))] // TODO is this supposed to be public?
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#[allow(unused)] // TODO is this supposed to be public?
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fn calibrate(&mut self, vref: &mut Vref) {
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fn calibrate(&mut self, vrefint: &mut VrefInt) {
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#[cfg(stm32l5)]
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let vref_cal: u32 = todo!();
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let vrefint_cal: u32 = todo!();
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#[cfg(not(stm32l5))]
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let vref_cal = unsafe { crate::pac::VREFINTCAL.data().read().value() };
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let vrefint_cal = unsafe { crate::pac::VREFINTCAL.data().read().value() };
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let old_sample_time = self.sample_time;
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// "Table 24. Embedded internal voltage reference" states that the sample time needs to be
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@ -300,11 +303,11 @@ impl<'d, T: Instance> Adc<'d, T> {
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self.sample_time = SampleTime::Cycles640_5;
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// This can't actually fail, it's just in a result to satisfy hal trait
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let vref_samp = self.read(vref);
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let vrefint_samp = self.read(vrefint);
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self.sample_time = old_sample_time;
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self.calibrated_vdda = (VDDA_CALIB_MV * u32::from(vref_cal)) / u32::from(vref_samp);
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self.vref = (VREF_CALIB_MV * u32::from(vrefint_cal)) / u32::from(vrefint_samp);
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}
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pub fn set_sample_time(&mut self, sample_time: SampleTime) {
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@ -315,9 +318,16 @@ impl<'d, T: Instance> Adc<'d, T> {
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self.resolution = resolution;
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}
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/// Set VREF used for [to_millivolts()] conversion.
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///
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/// Use this if you have a known precise VREF (VDDA) pin reference voltage.
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pub fn set_vref(&mut self, vref: u32) {
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self.vref = vref;
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}
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/// Convert a measurement to millivolts
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pub fn to_millivolts(&self, sample: u16) -> u16 {
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((u32::from(sample) * self.calibrated_vdda) / self.resolution.to_max_count()) as u16
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((u32::from(sample) * self.vref) / self.resolution.to_max_count()) as u16
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}
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/*
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