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b166ed6b78
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pennae b166ed6b78 rp: generalize adc inputs from pins to channels 
this lets us treat pins and the temperature sensor uniformly using the
same interface. uniformity in turn lets us add more adc features without
combinatorial explosion of methods and types needed to handle them all.
2023-08-01 18:31:28 +02:00
..
adc.rs rp: generalize adc inputs from pins to channels 2023-08-01 18:31:28 +02:00
cyw43-perf.rs cyw43: Update firmware in HIL test. 2023-07-28 23:58:47 +02:00
dma_copy_async.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
flash.rs rp: add async flash 2023-07-28 16:50:54 -06:00
float.rs rp: update rp-pac. 2023-06-16 01:41:07 +02:00
gpio_async.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
gpio_multicore.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
gpio.rs rp/gpio: fix is_set_high/is_set_low, expand tests. 2023-07-11 12:40:07 +02:00
multicore.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
pio_irq.rs rp: relocate programs implicitly during load 2023-07-28 19:33:02 +02:00
pio_multi_load.rs rp: relocate programs implicitly during load 2023-07-28 19:33:02 +02:00
pwm.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
spi_async.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
spi.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
uart_buffered.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
uart_dma.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
uart_upgrade.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00
uart.rs ci: run HIL tests in parallel. 2023-05-30 01:10:53 +02:00